Jesper Wallentin

Associate Senior Lecturer

Research areas and keywords

UKÄ subject classification

  • Accelerator Physics and Instrumentation
  • Condensed Matter Physics
  • Nano Technology

Research

My research studies single nanostructure devices using coherent X-ray imaging and X-ray diffraction. In particular, I'm developing techniques for investigations that combine hard X-ray imaging and X-ray diffraction with electrical measurements [1,4]. Hard X-rays can penetrate through thick samples, allowing measurements of devices in operando. The X-rays can both be used as a pump, to study for instance X-ray induced electrical conductance [4], or as a probe of the structure in nanodevices [1,2,5]. Nanowires have demonstrated much stronger response to hard X-rays than expected from bulk data [4]. We have shown that the shape of bent nanowires can be reconstructed in 3D with nanometre precision [1], and how simultaneous coherent imaging and diffraction can alleviate sample positioning [2].

The experiments require intense nanofocused X-ray beams that are only available at synchrotrons such as Petra-III and ESRF, and in the near future also at Max IV.

For an updated lists of publications, please see ResearcherID or Google Scholar. A selected list of recent work:

  1. J. Wallentin, M. Osterhoff, and T. Salditt, "In operando X-ray diffraction reveals electrically induced strain and bending in single nanowire device" Adv. Mater. In press (2015) http://dx.doi.org/10.1002/adma.201504188
  2. J. Wallentin, R. N. Wilke, M. Osterhoff, and T. Salditt, "Simultaneous high-resolution scanning Bragg contrast and ptychographic imaging of a single solar cell nanowire" J. Appl. Crystallogr. 48 (6), 1818 (2015) http://dx.doi.org/10.1107/S1600576715017975
  3. M. Osterhoff, C. Eberl, F. Döring, R. N. Wilke, J. Wallentin, H.-U. Krebs, M. Sprung, and T. Salditt, "Towards multi-order hard x-ray imaging with multilayer zone plates" J. Appl. Crystallogr. 48, 116 (2015) http://dx.doi.org/10.1107/S1600576714026016
  4. J. Wallentin, M. Osterhoff, R. N. Wilke, K.-M. Persson, L.-E. Wernersson, M. Sprung, and T. Salditt, "Hard X-ray detection using a single 100 nm-diameter nanowire" Nano Lett. 14 (12), 7071 (2014) http://dx.doi.org/10.1021/nl5040545
  5. R. N. Wilke, J. Wallentin, M. Osterhoff, D. Pennicard, A. Zozulya, M. Sprung, and T. Salditt, "High-flux ptychographic imaging using the new 55 mm pixel detector Lambda based on the Medipix3 readout chip" Acta Crystallogr. Sect. A A70 (6), 552 (2014) http://dx.doi.org/10.1107/S2053273314014545

Recent research outputs

Jesper Wallentin, Jacobsson, D., Osterhoff, M., Magnus T. Borgström & Salditt, T. 2017 Jul 12 In : Nano Letters. 17, 7, p. 4143-4150 8 p.

Research output: Contribution to journalArticle

Robisch, A. L., J. Wallentin, Pacureanu, A., Cloetens, P. & Salditt, T. 2016 Dec 1 In : Optics Letters. 41, 23, p. 5519-5522 4 p.

Research output: Contribution to journalArticle

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