A tailored 200 parameter VME based data acquisition system for IBA at the Lund Ion Beam Analysis Facility - Hardware and software
Research output: Contribution to journal › Article
With the recent advances towards modern Ion Beam Analysis (IBA), going from one- or few-parameter detector systems to multi-parameter systems, it has been necessary to expand and replace the more than twenty years old CAMAC based system. A new VME multi-parameter (presently up to 200 channels) data acquisition and control system has been developed and implemented at the Lund Ion Beam Analysis Facility (LIBAF). The system is based on the VX-511 Single Board Computer (SBC), acting as master with arbiter functionality and consists of standard VME modules like Analog to Digital Converters (ADC's), Charge to Digital Converters (QDC's), Time to Digital Converters (TDC's), scaler's, IO-cards, high voltage and waveform units. The modules have been specially selected to support all of the present detector systems in the laboratory, with the option of future expansion. Typically, the detector systems consist of silicon strip detectors, silicon drift detectors and scintillator detectors, for detection of charged particles, X-rays and γ-rays. The data flow of the raw data buffers out from the VME bus to the final storage place on a 16 terabyte network attached storage disc (NAS-disc) is described. The acquisition process, remotely controlled over one of the SBCs ethernet channels, is also discussed. The user interface is written in the Kmax software package, and is used to control the acquisition process as well as for advanced online and offline data analysis through a user-friendly graphical user interface (GUI). In this work the system implementation, layout and performance are presented. The user interface and possibilities for advanced offline analysis are also discussed and illustrated.
|Research areas and keywords||
Subject classification (UKÄ) – MANDATORY
|Journal||Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms|
|State||Published - 2016 Mar 15|