Test Cost Reduction of 3D Stacked ICs: Test Planning and Test Flow Selection

Larsson, E. (First/primary/lead supervisor)

Integrated Electronic Systems

Activity: Examination and supervision › Supervision of PhD students

Period	2020 Sept 4
Examinee/Supervised person	Anders Larsson
Degree of Recognition	International

Documents & Links

https://portal.research.lu.se/portal/en/publications/test-cost-reduction-of-3d-stacked-ics(b6b772e7-0e96-4e2d-8764-4d10d7ce373a).html