X-ray beam induced current (XBIC) imaging of single n-i-n doped InGaP nanowire device

  • Lert Chayanun (Presenter)

Activity: Talk or presentation › Presentation

Period2017 May 29
Event titleNanowire Week, 2017
Event typeConference
LocationLund, SwedenShow on map
Degree of RecognitionInternational