Facility for TEM and site-specific sample preparation from hard materials

Infrastructure

    Infrastructure Details

    Acronym

    SamplePrep

    Description

    The infrastructure offers a complete set of tools for the preparation of site specific and transmission electron microscopy (TEM) specimens from hard solid materials with the accuracy of target positioning at least 10 μm. It includes instruments for the preparation of flat-surface, thin-foil and section specimens by electric-discharge, mechanical and ultrasonic cutting, punching, mechanical parallel-surface and dimple grinding, and final electro-polishing or precision ion-milling to electron transparency. These are achieved by using a specific selection from the instrument pool.

    This infrastructure can also be suitable for the preparation of specimens for large-scale facilities, e.g. needles for tomographic X-ray imaging.

    Equipment and resources

    Full list of instruments including brief description for each is available at the Facility webpage.
    This infrastructure is mostly split between two rooms M:2384-2385 in the M-house (Kenicentrum IV at present) of LTH. One instrument (electric-discharge machine) is located in the mechanical workshop of the department of mechanical engineering of M-house.

    Management of the infrastructure

    The infrastructure is managed by Prof. Dmytro Orlov (Division of Materials Engineering) in consultations with Prof. Reine Wallenberg (nCHREM)

    UKÄ subject classification

    • Materials Engineering

    Type of infrastructure

    • Equipment

    Keywords

    • Mechanical grinding
    • Mechanical polishing
    • diamond-wire cutting
    • disk-blade cutting
    • oxide polishing
    • broad ion-beam polishing
    • focused ion-beam polishing
    • SEM sample preparation
    • TEM sample preparation