Lund University Scanning Probe Facility


    Infrastructure Details




    The Scanning Probe Facility mainly builds on scanning tunneling microscopy and spectroscopy (STM) and atomic force microscopy (AFM). Experiments can be performed in ultrahigh vacuum conditions, in air, and in liquids (AFM). Research focuses on the surface characterization of semiconductor nanostructures, catalytically active materials, and two-dimensional materials, but also includes other types of samples. Correlation of structural, mechanical, and electronic properties across interfaces and heterostructures of technologically relevant materials at the atomic scale is one of the driving goals.

    Equipment and resources

    - Omicron STM 1: UHV STM with Auger, LEED, mass spectrometry, and evaporation and deposition sources
    - Omicron VT STM: UHV STM with q-Plus AFM functionality and 4 separate contacts for electrical measurements
    - Omicron VT STM: variable-temperature UHV STM with LEED and 4 separate contacts for electrical measurements
    - Sigma Surface Science Infinity STM: low-temperature UHV STM with closed-cycle cryostat, q-Plus AFM functionality, and 4 separate contacts for electrical measurements
    - Unisoku SEUL STM: small, light-weight, open-geometry STM for flexible environments, with q-Plus AFM functionality
    - JEOL JSTM: flexible STM for operation in UHV or in air
    - JPK Nanowizard II (belongs to the division of Solid State Physics, LTH): AFM for operation in air or liquid environment, with c-AFM and KPFM functionality
    - Nanosurf Naio AFM: small, flexible AFM

    Management of the infrastructure

    The infrastructure is jointly managed by the following professors and associate professors of the division:Anders Mikkelsen, Rainer Timm, Edvin Lundgren, Jan Knudsen, Joachim Schnadt

    UKÄ subject classification

    • Natural Sciences
    • Condensed Matter Physics
    • Manufacturing, Surface and Joining Technology
    • Nano Technology

    Type of infrastructure

    • Equipment


    • scanning tunneling microscopy
    • atomic force microscopy
    • scanning probe microscopy