National Center for High Resolution Electron Microscopy - ARTEMI Atomic Resolution TEM infrastructure of Sweden

nCHREM

nCHREM is a national infrastructure, supported by VR. It is part of ARTEMI (Atomic Resolution TEM Infrastructure network), a network of similar national infrastructures in Sweden. In 2021, ARTEMI was recognized as an infrastructure of National interest by the Infrastructure council at VR

Close collaborations with other LU infrastructures, like LNL, FTF's optical and electrical characterization labs, nCHREM and LUSP.

nCHREM is a center for electron microscopy and chemical composition analysis on the sub-nanometer scale. It can cover an unusually wide range of specimens from hard inorganic materials (oxides, metals and semiconductors) to soft materials (biological, colloidal systems, proteins). Direct imaging of crystal structures and nanoparticles down to 0.86 Å resolution can be performed, as well as electron diffraction and element mapping/point analyses. Through specialized specimen holders, we can inspect samples in temperature ranges from -190°C to +1000°C. We specialize in real-time imaging on the atomic scale of reactions inside the microscope and also on cryo-TEM of frozen liquid samples. It was formed in 1987, and has had several upgrades of instruments and buildings. We perform cutting-edge research within our group to develop the techniques, and maintain the level of competence.

The infrastructure consists of three transmission electron microscopes (TEMs) and one scanning electron microscope (SEM). The range of TEMs have; 1) High spatial resolution (down to 0.086 nm), capable of qualitative and quantitative chemical analysis; 2) High sample tilt for tomography; 3) Gas-injection for studies of growth of nanostructures from gas precursors. The SEM is a high-resolution SEM capable of chemical analysis.

Jeol JEM-3000F - analytical TEM with a field-emission Gun. For structural imaging, the resolution is 0.17 nm in conventional mode, and 0.13 nm in Scanning TEM mode with high-angle annular detector (HAADF). For chemical analysis, the spatial precision is better than 1 nm using an energy dispersive x-ray (EDX) detector. Sample holders for low temperature (liquid nitrogen) and heating. The TEM also has a special sample holder for in-situ scanning tunneling microscopy in combination with TEM imaging.
Hitachi HF-3300 ETEM - environmental transmission electron microscope, specially designed to study the growth of III-V semiconductor nanostructures. With a cold field-emission gun and an imaging Cs corrector the resolution is below 1 Å (0.1 nm). Equipped with an Oxford EDX for analysis of chemical composition. A gas handling system for different precursors is connected to the microscope. Sample heating is done using MEMS chips.
Jeol JEM-2200FS - cryo-TEM for low dose imaging and tomography with a field-emission gun. the point-to-point resolution is 0.28 nm and around 0.30 nm in STEM mode. An Omega filter allows electron energy loss spectra (EELS) and energy-filtered images to be acquired.
Jeol JSM-6700F - SEM with a field-emission gun for morphology studies and element analysis. It has detectors for both secondary (in-lens and low angle) and backscattered electrons. It is equipped with an Oxford EDX detector for chemical analysis.

We provide high-performance equipment and the highest competence in imaging, analysis and interpretation of data to other academic groups within LU as well as internationally. We also provide service and collaboration to industrial partners on small or more advanced long-term projects. We take part in education in workshops and regular teaching, and site-specific training of users with previous experience from electron microscopy.

Local data storage on local server and transfer via USB memories to the users' computers.

Steering committee:
Reine Wallenberg, CAS
Martin Ek Rosén, CAS
Karin Schillén, Phys. Chem
Kimberly Dick Thelander, CAS/Physics