Surface Characterization

The instruments can be used for measurements of the surface properties such as absorption, desorption, interactions, structure and surface tension.

Spectroscopic Ellipsometer (Horiba) - sealed fluidic sample chamber

Ellipsometer (Rudolph Research) - open fluidic sample chamber with stirring

Multiskop (Optrel) - ellipsometry, imaging, surface plasmons, Brewster angle microscopy

Quartz Crystal Microbalance (Q-Sense) - adsorption, interactions and mechanical properties in ultra-thin films

Atomic Force Microscope (Park Systems) - force measurement, topographic imaging, with optional fluidic measurement chamber

Langmuir Devices (KSV Instruments) - investigate properties of floating monolayers

Drop and Bubble Shape Tensiometer (Sinterface) – surface tension of liquids, contact angle, dynamic measurement, fast oscillation

Documentation can be found on the Laboratory Information Management Systems (LIMS)

instrument.physchem.lu.se (see links)

The equipment may be used with the help of a trained operator.