Personal profile
Research
Erik Larsson received his M.Sc., Tech. Lic, Ph.D, and Docent from Linköping University in 1994, 1998, 2000, 2006, respectively. He did his Post Doc at the Computer Design and Test Laboratory at Nara Institute of Science and Technology (NAIST), Japan (October 2001-December 2002) , and was through Swedish Foundation for Strategic Research (SSF) (Strategic mobility) at NXP Semiconductors, Eindhoven, The Netherlands (October 2008-May 2010). From 2002 until 2012 he was with Linköping University as an Assistant Professor (2002-2005) and as Associate Professor (2006-2012). He joined Lund University as Associate Professor in 2012. From 2018 he is Professor in Computer Architecture.
His current research interests include test planning for manufacturing test, test during operation (in-situ), scan-chain diagnosis, silicon debug and validation, IJTAG/SJTAG, stacked 3D chip test, fault-tolerance for MPSoCs (Multi-Processor System-on-Chip), and property checking in distributed systems (MPSOcS with Network-on-Chip (NoC)). He authored the book Introduction to Advanced System-on-Chip Test Design and Optimization (Springer 2005). Erik Larsson is a Senior member of IEEE.
He has received a number of best paper awards:
- "Integrated Test Scheduling, Test Parallelization and TAM Design" received the best paper award at IEEE Asian Test Symposium (ATS), 2002
- "Architecture for Integrated Test Data Compression and Abort-on-Fail Testing in a Multi-Site Environment" received the Institution of Engineering and Technology (IET) Premium Award, 2009
- "A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring" received the best paper award at the IEEE European Test Symposium (ETS), 2016
- “Test Flow Selection for Stacked Integrated Circuits” received the 2019 JETTA-TTTC Best Paper Award
He supervised the following awardes theses:
- Best Bachelor thesis at Linköping University supported by Föreningen Svenskt Näringsliv, 2002
- Best thesis at the Department of Computer and Information Science, 2004 and 2005
- Best Master thesis in Engineering in Sweden ( "Lilla Polhemspriset" 2008)
Some other recognitions:
- "An Integrated System-on-Chip Test Framework" has been selected to be included in Design, Automation, and Test in Europe, The Most Influential Papers of 10 Years DATE, 2008
- "Integrated Test Scheduling, Test Parallelization and TAM Design" has been selected to be included in the Asian Test Symposium 20th Anniversary Compendium of Papers (2011)
- "Design, Verification, and Application of IEEE 1687" has been selected to be included in the Asian Test Symposium 30th Anniversary Compendium of Papers (2021)
Subject classification (UKÄ)
- Computer Systems
- Embedded Systems
- Other Electrical Engineering, Electronic Engineering, Information Engineering
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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SDG 3 Good Health and Well-being -
SDG 4 Quality Education -
SDG 7 Affordable and Clean Energy -
SDG 8 Decent Work and Economic Growth -
SDG 9 Industry, Innovation, and Infrastructure -
SDG 12 Responsible Consumption and Production -
SDG 16 Peace, Justice and Strong Institutions
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Collaborations the last five years
Research output
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Accessing general IEEE Std. 1687 networks via functional ports
Larsson, E., Murali, P. & Zhang, Z., 2021, International Test Conference. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 354-363 10 p.Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review
File180 Downloads (Pure) -
Securing IEEE 1687 (IJTAG)
Åhlund, J., Törmänen, M. & Larsson, E., 2025 Dec 3.Research output: Contribution to conference › Paper, not in proceeding
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Secure and efficient sharing of on-chip resources
Åhlund, J., Törmänen, M. & Larsson, E., 2025 Sept 25, International test Conference (ITC) 2025. IEEE - Institute of Electrical and Electronics Engineers Inc., p. 474-477 4 p.Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review
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Securing reconfigurable scan networks against data sniffing and data alteration attacks
Åhlund, J., Törmänen, M., Svensson, P., Kerttu, M., Månefjord, T., Johansson, C. & Larsson, E., 2025 May 28, 2025 IEEE European Test Symposium (ETS). IEEE - Institute of Electrical and Electronics Engineers Inc., 6 p.Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review
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Large Language Models for Printed Circuit Board Test Generation
Lidbäck, A. & Larsson, E., 2025, 2025 IEEE 26th Latin American Test Symposium (LATS). IEEE - Institute of Electrical and Electronics Engineers Inc., 2 p.Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review
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Distributed Digital Beamforming for cmWave and mmWave 6G Integrated Sensing and Communication
Larsson, E. (Researcher)
2024/11/01 → 2027/08/31
Project: Research
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Trustable systems with components from untrustable supply-chains
Larsson, E. (PI)
Swedish Government Agency for Innovation Systems (Vinnova)
2023/05/01 → 2026/04/30
Project: Research
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Lund University Digital Interactive Concert Hall - LUDICH
Larsson, J. (Researcher), Nordberg, A. (Researcher), Hjorth, D. (Researcher), Lukoseviciene, A. (Researcher) & Larsson, E. (Researcher)
2022/09/01 → 2025/12/31
Project: Research
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Lågkomplexitets multi-antenn radioarkitekturer för millimetervågområdet
Larsson, E. (PI)
Swedish Government Agency for Innovation Systems (Vinnova)
2022/08/01 → 2024/07/31
Project: Research
Activities
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THE 34TH IEEE ASIAN TEST SYMPOSIUM & THE 9TH IEEE INTERNATIONAL TEST CONFERENCE IN ASIA
Larsson, E. (Organiser)
2026 Dec 16 → 2026 Dec 19Activity: Participating in or organising an event › Organisation of conference
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IEEE European Test Symposium
Larsson, E. (Member of programme committee)
2026 May 25 → 2026 May 29Activity: Participating in or organising an event › Organisation of conference
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VLSI Test Symposium
Larsson, E. (Member of programme committee)
2026 Apr 27 → 2026 Apr 29Activity: Participating in or organising an event › Organisation of conference
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The International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Larsson, E. (Member of programme committee)
2026 Apr 27 → 2026 Apr 29Activity: Participating in or organising an event › Organisation of conference
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Design Automation and Test in Europe (DATE)
Larsson, E. (Member of programme committee)
2026 Apr 20 → 2026 Apr 22Activity: Participating in or organising an event › Organisation of conference
Prizes and Distinction
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Best paper at Journal of Electronic Testing Theory and Applications
Sengupta, B. (Recipient), Nikolov, D. (Recipient), Dash, A. (Recipient) & Larsson, E. (Recipient), 2020
Prize: Prize (including medals and awards)
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Best paper award at the European Test Symposium (ETS)
Ghani Zadegan, F. (Recipient), Nikolov, D. (Recipient) & Larsson, E. (Recipient), 2017 May 24
Prize: Prize (including medals and awards)
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Premium Award (Best paper) of Institution of Engineering and Technology
Larsson, E. (Recipient), 2009
Prize: Prize (including medals and awards)
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Best paper award at IEEE Asian Test Symposium (ATS)
Larsson, E. (Recipient), Arvidsson, K. (Recipient), Fujiwara, H. (Recipient) & peng, Z. (Recipient), 2002
Prize: Prize (including medals and awards)