Maik Kahnt
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  • Hard x-ray nanoprobe of beamline P06 at PETRA III

    Schroer, C. G., Baumbach, C., Döhrmann, R., Klare, S., Hoppe, R., Kahnt, M., Patommel, J., Reinhardt, J., Ritter, S., Samberg, D., Scholz, M., Schropp, A., Seiboth, F., Seyrich, M., Wittwer, F. & Falkenberg, G., 2016 Jul 27, Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. Chubar, O., Jarrige, I., Kaznatcheev, K., Miller, L., Stavitski, E., Tanabe, T., Shaftan, T., Shen, Q., Pindak, R., Nelson, C., Kalbfleisch, S., Thieme, J., Williams, G., Fuchs, M., Rumaiz, A., Wang, J., Evans-Lutterodt, K., Lee, W-K., McSweeney, S. & Vescovo, E. (eds.). American Institute of Physics (AIP), Vol. 1741. 030007

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

    14 Citations (SciVal)
  • Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

    Schroer, C. G., Seyrich, M., Schropp, A., Döhrmann, R., Botta, S., Wiljes, P., Brückner, D., Kahnt, M., Wittwer, F., Grote, L., Koziej, D., Garrevoet, J. & Falkenberg, G., 2019 Jan 1, X-Ray Nanoimaging: Instruments and Methods IV. Lai, B. & Somogyi, A. (eds.). SPIE, 111120D. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11112).

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

    7 Citations (SciVal)
  • PtyNAMi: Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

    Schroer, C. G., Seyrich, M., Kahnt, M., Botta, S., Döhrmann, R., Falkenberg, G., Garrevoet, J., Lyubomirskiy, M., Scholz, M., Schropp, A. & Wittwer, F., 2017 Jan 1, X-Ray Nanoimaging: Instruments and Methods III. Somogyi, A. & Lai, B. (eds.). SPIE, Vol. 10389. 103890E

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

    14 Citations (SciVal)
  • Quantitative characterization of aberrations in x-ray optics

    Seiboth, F., Kahnt, M., Scholz, M., Seyrich, M., Wittwer, F., Garrevoet, J., Falkenberg, G., Schropp, A. & Schroer, C. G., 2016 Jan 1, Advances in X-Ray/EUV Optics and Components XI. Morawe, C., Khounsary, A. M. & Goto, S. (eds.). SPIE, Vol. 9963. 99630P

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

    13 Citations (SciVal)