Project Details
| Status | Finished |
|---|---|
| Effective start/end date | 2014/05/01 → 2019/04/12 |
Free keywords
- synchrotron radiation
- III-V semiconductors
- high-k oxides
- passivation
- doping
- XPS
- AP-XPS
- SPEM
- XRF
- full field X-ray diffraction microscopy
Synchrotron X-ray based characterization of technologically relevant III-V surfaces and nanostructures
- Troian, Andrea (Research student)
- Timm, Rainer (Supervisor)
- Mikkelsen, Anders (Assistant supervisor)
Project: Dissertation