Abstract
This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.
Original language | English |
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Title of host publication | 2016 IEEE International Symposium on Antennas and Propagation (APSURSI), AP-S 2016 |
Publisher | IEEE - Institute of Electrical and Electronics Engineers Inc. |
Pages | 1025-1026 |
Number of pages | 2 |
ISBN (Electronic) | 9781509028863 |
DOIs | |
Publication status | Published - 2016 Oct 25 |
Event | IEEE International Symposium on Antennas and Propagation, 2016 - Fajardo, Puerto Rico, United States Duration: 2016 Jun 26 → 2016 Jul 1 |
Conference
Conference | IEEE International Symposium on Antennas and Propagation, 2016 |
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Country/Territory | United States |
City | Fajardo, Puerto Rico |
Period | 2016/06/26 → 2016/07/01 |
Subject classification (UKÄ)
- Electrical Engineering, Electronic Engineering, Information Engineering
Free keywords
- 60 GHz
- imaging
- near-field techniques