60 GHz imaging of panels for defect detection using planar scanning

Jakob Helander, Andreas Ericsson, Daniel Sjöberg, Mats Gustafsson, Torleif Martin, Christer Larsson

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

This paper presents imaging results of measurements conducted at 60 GHz, using the planar rectangular near-field technique. Utilizing the stated techniques at higher frequencies enables detection of smaller defects, and allows for a small measurement set-up in a laboratory environment. An algorithm based on the Fast Fourier Transform (FFT) has been developed in order to process the data. The paper provides measurement results for an illustrative panel, which show clear detection of the distributed defects. The purpose of this work is to enable processing of recent data from measurements of industrial composite panels.
Original languageEnglish
Title of host publication2016 IEEE International Symposium on Antennas and Propagation (APSURSI), AP-S 2016
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
Pages1025-1026
Number of pages2
ISBN (Electronic)9781509028863
DOIs
Publication statusPublished - 2016 Oct 25
EventIEEE International Symposium on Antennas and Propagation, 2016 - Fajardo, Puerto Rico, United States
Duration: 2016 Jun 262016 Jul 1

Conference

ConferenceIEEE International Symposium on Antennas and Propagation, 2016
Country/TerritoryUnited States
CityFajardo, Puerto Rico
Period2016/06/262016/07/01

Subject classification (UKÄ)

  • Electrical Engineering, Electronic Engineering, Information Engineering

Free keywords

  • 60 GHz
  • imaging
  • near-field techniques

Fingerprint

Dive into the research topics of '60 GHz imaging of panels for defect detection using planar scanning'. Together they form a unique fingerprint.

Cite this