Abstract
An all digital phase-locked loop (ADPLL) has been implemented in a 90-nm CMOS process. It uses a phase-frequency detector (PFD) connected to two time-to-digital converters (TDC). To save power the TDCs use delay line cells with uneven delay time. During frequency acquisition an automatic tuning bank controller selects active bank of the digitally controlled oscillator (DCO), which features three separate tuning banks for both high resolution and wide frequency tuning range. To further increase the resolution a high-speed delta-sigma modulator is also used, modulating the DCO fine tuning word. The PLL achieves a measured phase noise of -125dBc/Hz at 1MHz offset from a divided-by-2 carrier frequency of 2.58GHz. The core area is 0.33mm2 and the current consumption is 30mA from a 1.2V supply.
Original language | English |
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Pages (from-to) | 49-59 |
Journal | Analog Integrated Circuits and Signal Processing |
Volume | 66 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2011 |
Subject classification (UKÄ)
- Electrical Engineering, Electronic Engineering, Information Engineering
Free keywords
- RF
- Digitally Controlled Oscillator (DCO)
- Phase Locked Loop (PLL)
- Time-to-Digital Converter (TDC)
- All Digital Phase-Locked Loop (ADPLL)
- CMOS