Abstract
We describe a device to study reactions relevant for the Single Event Effect (SEE) in microelectronics by means of 200A and 300AMeV, inverse kinematics, Si + H and Si + D reactions. The work is focused on the possibility to measure Z = 2-14 projectile fragments as efficiently as possible. During commissioning and first experiments the fourth quadrant of the CELSIUS storage ring acted as a spectrometer to register fragments in two planes of Si strip detectors in the angular region 0 degrees-0.6 degrees. A combination of ring-structured and sector-structured Si strip detector planes operated at angles 0.6 degrees-1.1 degrees. For specific event tagging a Si+ phoswich scintillator wall operated in the range 3.9 degrees-11.7 degrees and Si Delta E-E telescopes of CHICSi type operated at large angles. (c) 2007 Elsevier B.V. All rights reserved.
Original language | English |
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Pages (from-to) | 385-398 |
Journal | Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment |
Volume | 578 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2007 |
Subject classification (UKÄ)
- Accelerator Physics and Instrumentation
Free keywords
- inverse kinematics
- single event effects
- fragmentation detectors