TY - GEN
T1 - A polynomial-time bound for matching and registration with outliers
AU - Olsson, Carl
AU - Enqvist, Olof
AU - Kahl, Fredrik
PY - 2008
Y1 - 2008
N2 - We present a framework for computing optimal transformations, aligning one point set to another, in the presence of outliers. Example applications include shape matching and registration (using, for example, similarity, affine or projective transformations) as well as multiview reconstruction problems (triangulation, camera pose etc.). While standard methods like RANSAC essentially use heuristics to cope with outliers, we seek to find the largest possible subset of consistent correspondences and the globally optimal transformation aligning the point sets. Based on theory from computational geometry, we show that this is indeed possible to accomplish in polynomial-time. We develop several algorithms which make efficient use of convex programming. The scheme has been tested and evaluated on both synthetic and real data for several applications.
AB - We present a framework for computing optimal transformations, aligning one point set to another, in the presence of outliers. Example applications include shape matching and registration (using, for example, similarity, affine or projective transformations) as well as multiview reconstruction problems (triangulation, camera pose etc.). While standard methods like RANSAC essentially use heuristics to cope with outliers, we seek to find the largest possible subset of consistent correspondences and the globally optimal transformation aligning the point sets. Based on theory from computational geometry, we show that this is indeed possible to accomplish in polynomial-time. We develop several algorithms which make efficient use of convex programming. The scheme has been tested and evaluated on both synthetic and real data for several applications.
M3 - Paper in conference proceeding
SP - 3230
EP - 3237
BT - 2008 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, VOLS 1-12
PB - IEEE - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops), 2008
Y2 - 23 June 2008 through 28 June 2008
ER -