A pre-sample charge measurement system for quantitative NMP-analysis

Per Kristiansson, Maciek Borysiuk, Natalia Arteaga, Mikael Elfman, Erik Fors, Charlotta Nilsson, Jan Pallon

    Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

    Abstract

    In many IBA applications the main aim is to obtain quantitative figures characterizing the sample. Normally charge, i.e. number of probe particles, is used for normalization and is measured either by collecting the charge deposited in the sample or by collecting the particle in a post-sample Faraday cup or in combination. Both these techniques have drawbacks and results can be difficult to compare for samples with different matrix composition. In this work, we present an upgraded design and test results from the Lund NMP pre-sample charge measurement system. The system presented is based on a pre-sample beam deflection controlled by the beam scanning system for the nuclear microprobe. It can be operated in different modes, but during normal operation the beam is blanked once per pixel and the corresponding charge is collected during the beam-off period. The system does not only measure an average of the beam current during data collection, but actually a pixel-by-pixel normalization is possible. Data of the system performance are presented and in addition illustrations of how quantitative measurements both for PIXE and elastic scattering can be made more reliable. (C) 2010 Elsevier B.V. All rights reserved.
    Original languageEnglish
    Title of host publicationNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms
    PublisherElsevier
    Pages1727-1730
    Volume268
    DOIs
    Publication statusPublished - 2010
    Event19th International Conference on Ion Beam Analysis - Cambridge, ENGLAND
    Duration: 2009 Sept 72009 Sept 11

    Publication series

    Name
    Number11-12
    Volume268
    ISSN (Print)0168-583X

    Conference

    Conference19th International Conference on Ion Beam Analysis
    Period2009/09/072009/09/11

    Bibliographical note

    The information about affiliations in this record was updated in December 2015.
    The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007)

    Subject classification (UKÄ)

    • Subatomic Physics

    Free keywords

    • Faraday cup
    • Charge measurement
    • Nuclear microprobe
    • Quantitative
    • Beam blanker
    • analysis

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