Abstract
This paper presents an analysis with the aim of characterizing an
arbitrary linear, bianisotropic material inside a metallic
waveguide. The result is that if the number of propagating modes are
the same inside and outside the material under test, it is possible to
determine the propagation constants of the modes inside the material
by using scattering data from two samples with different lengths. Some
information can also be obtained on the cross-sectional shape of the
modes, but it remains an open question if this information can be used
to characterize the material. The method is illustrated by numerical
examples, determining the complex permittivity for lossy isotropic and
anisotropic materials.
arbitrary linear, bianisotropic material inside a metallic
waveguide. The result is that if the number of propagating modes are
the same inside and outside the material under test, it is possible to
determine the propagation constants of the modes inside the material
by using scattering data from two samples with different lengths. Some
information can also be obtained on the cross-sectional shape of the
modes, but it remains an open question if this information can be used
to characterize the material. The method is illustrated by numerical
examples, determining the complex permittivity for lossy isotropic and
anisotropic materials.
| Original language | English |
|---|---|
| Publisher | [Publisher information missing] |
| Number of pages | 23 |
| Volume | TEAT-7152 |
| Publication status | Published - 2007 |
Publication series
| Name | Technical Report LUTEDX/(TEAT-7152)/1-23/(2007) |
|---|---|
| Volume | TEAT-7152 |
Bibliographical note
Published version: Progress In Electromagnetics Research B, Vol. 12, pp. 163-182, 2009.Subject classification (UKÄ)
- Electrical Engineering, Electronic Engineering, Information Engineering