Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V. Favre-Nicolin; F. Mastropietro; J. Eymery; D. Camacho; Y. M. Niquet; Mattias Borg; Maria Messing; Lars-Erik Wernersson; R. E. Algra; E. P. A. M. Bakkers; T. H. Metzger; R. Harder; I. K. Robinson

doi:10.1088/1367-2630/12/3/035013

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

V. Favre-Nicolin, F. Mastropietro, J. Eymery, D. Camacho, Y. M. Niquet, Mattias Borg, Maria Messing, Lars-Erik Wernersson, R. E. Algra, E. P. A. M. Bakkers, T. H. Metzger, R. Harder, I. K. Robinson

Research output: Contribution to journal › Article › peer-review

Abstract

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

Original language	English
Article number	035013
Journal	New Journal of Physics
Volume	12
DOIs	https://doi.org/10.1088/1367-2630/12/3/035013
Publication status	Published - 2010

Subject classification (UKÄ)

Condensed Matter Physics
Electrical Engineering, Electronic Engineering, Information Engineering

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Favre-Nicolin, V., Mastropietro, F., Eymery, J., Camacho, D., Niquet, Y. M., Borg, M., Messing, M., Wernersson, L.-E., Algra, R. E., Bakkers, E. P. A. M., Metzger, T. H., Harder, R., & Robinson, I. K. (2010). Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging. New Journal of Physics, 12, Article 035013. https://doi.org/10.1088/1367-2630/12/3/035013

@article{90b05e7e409d4398be99c569df4a7900,

title = "Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging",

abstract = "Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.",

author = "V. Favre-Nicolin and F. Mastropietro and J. Eymery and D. Camacho and Niquet, {Y. M.} and Mattias Borg and Maria Messing and Lars-Erik Wernersson and Algra, {R. E.} and Bakkers, {E. P. A. M.} and Metzger, {T. H.} and R. Harder and Robinson, {I. K.}",

year = "2010",

doi = "10.1088/1367-2630/12/3/035013",

language = "English",

volume = "12",

journal = "New Journal of Physics",

issn = "1367-2630",

publisher = "IOP Publishing",

}

TY - JOUR

T1 - Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

AU - Favre-Nicolin, V.

AU - Mastropietro, F.

AU - Eymery, J.

AU - Camacho, D.

AU - Niquet, Y. M.

AU - Borg, Mattias

AU - Messing, Maria

AU - Wernersson, Lars-Erik

AU - Algra, R. E.

AU - Bakkers, E. P. A. M.

AU - Metzger, T. H.

AU - Harder, R.

AU - Robinson, I. K.

PY - 2010

Y1 - 2010

N2 - Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

AB - Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this paper, we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. We also discuss the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

U2 - 10.1088/1367-2630/12/3/035013

DO - 10.1088/1367-2630/12/3/035013

M3 - Article

SN - 1367-2630

VL - 12

JO - New Journal of Physics

JF - New Journal of Physics

M1 - 035013

ER -

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Abstract

Subject classification (UKÄ)

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