BETSEE: testing for system-wide effects of single event effects on ITk strip modules

C. Belanger-Champagne; J. Dandoy; B. Gallop; T. Gosart; C. Helling; P. Keener; K. Krizka; B. McGovern; G. Mullier; A. L. Poley; B. Roberts; C. Sawyer; A. Wall; H. Wang; M. Warren

doi:10.1088/1748-0221/18/01/C01019

BETSEE: testing for system-wide effects of single event effects on ITk strip modules

C. Belanger-Champagne, J. Dandoy, B. Gallop, T. Gosart, C. Helling, P. Keener, K. Krizka, B. McGovern, G. Mullier, A. L. Poley, B. Roberts, C. Sawyer, A. Wall, H. Wang, M. Warren

Particle and nuclear physics

Research output: Contribution to journal › Article › peer-review

Abstract

The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

Original language	English
Article number	C01019
Journal	Journal of Instrumentation
Volume	18
Issue number	1
DOIs	https://doi.org/10.1088/1748-0221/18/01/C01019
Publication status	Published - 2023 Jan 1

Subject classification (UKÄ)

Subatomic Physics

Free keywords

Digital electronic circuits
Front-end electronics for detector readout
Radiation-hard detectors

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10.1088/1748-0221/18/01/C01019

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Belanger-Champagne, C., Dandoy, J., Gallop, B., Gosart, T., Helling, C., Keener, P., Krizka, K., McGovern, B., Mullier, G., Poley, A. L., Roberts, B., Sawyer, C., Wall, A., Wang, H., & Warren, M. (2023). BETSEE: testing for system-wide effects of single event effects on ITk strip modules. Journal of Instrumentation, 18(1), Article C01019. https://doi.org/10.1088/1748-0221/18/01/C01019

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title = "BETSEE: testing for system-wide effects of single event effects on ITk strip modules",

abstract = "The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.",

keywords = "Digital electronic circuits, Front-end electronics for detector readout, Radiation-hard detectors",

author = "C. Belanger-Champagne and J. Dandoy and B. Gallop and T. Gosart and C. Helling and P. Keener and K. Krizka and B. McGovern and G. Mullier and Poley, {A. L.} and B. Roberts and C. Sawyer and A. Wall and H. Wang and M. Warren",

year = "2023",

month = jan,

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doi = "10.1088/1748-0221/18/01/C01019",

language = "English",

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journal = "Journal of Instrumentation",

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Belanger-Champagne, C, Dandoy, J, Gallop, B, Gosart, T, Helling, C, Keener, P, Krizka, K, McGovern, B, Mullier, G, Poley, AL, Roberts, B, Sawyer, C, Wall, A, Wang, H & Warren, M 2023, 'BETSEE: testing for system-wide effects of single event effects on ITk strip modules', Journal of Instrumentation, vol. 18, no. 1, C01019. https://doi.org/10.1088/1748-0221/18/01/C01019

TY - JOUR

T1 - BETSEE

T2 - testing for system-wide effects of single event effects on ITk strip modules

AU - Belanger-Champagne, C.

AU - Dandoy, J.

AU - Gallop, B.

AU - Gosart, T.

AU - Helling, C.

AU - Keener, P.

AU - Krizka, K.

AU - McGovern, B.

AU - Mullier, G.

AU - Poley, A. L.

AU - Roberts, B.

AU - Sawyer, C.

AU - Wall, A.

AU - Wang, H.

AU - Warren, M.

PY - 2023/1/1

Y1 - 2023/1/1

N2 - The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

AB - The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

KW - Digital electronic circuits

KW - Front-end electronics for detector readout

KW - Radiation-hard detectors

U2 - 10.1088/1748-0221/18/01/C01019

DO - 10.1088/1748-0221/18/01/C01019

M3 - Article

AN - SCOPUS:85146491173

SN - 1748-0221

VL - 18

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 1

M1 - C01019

ER -

BETSEE: testing for system-wide effects of single event effects on ITk strip modules

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Subject classification (UKÄ)

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