Characterization of non-vertically aligned semiconductor nanowires by THz emission measurements

I. Beleckaite, R. Adomavicius, G. Molis, A. Siusys, A. Reszka, T. Wojciechowski, J. Sadowski, A. Krotkus

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

In this work terahertz (THz) pulse emission of the non-vertically aligned GaAs core-shell nanowires (NWs) is investigated. THz emission azimuthal dependencies of different NW samples have been measured. It is shown that these measurements together with theoretical calculations could be a very promising method to determine the effective index of refraction (n0) of the NW ensemble. The measurement of azimuthal dependencies are confirmed to be a much more sensitive way for measuring n0 than traditional THz TDS method.

Original languageEnglish
Title of host publication41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
PublisherIEEE Computer Society
Volume2016-November
ISBN (Electronic)9781467384858
DOIs
Publication statusPublished - 2016 Nov 28
Event41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016 - Copenhagen, Denmark
Duration: 2016 Sept 252016 Sept 30

Conference

Conference41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016
Country/TerritoryDenmark
CityCopenhagen
Period2016/09/252016/09/30

Subject classification (UKÄ)

  • Nano Technology

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