Checking Pipelined Distributed Global Properties for Post-silicon Debug

Erik Larsson, Bart Vermeulen, Kees Goossens

Research output: Contribution to conference › Paper, not in proceeding › peer-review

Original language	English
Publication status	Published - 2010
Externally published	Yes
Event	IEEE Eleventh Workshop on RTL and High Level Testing, 2010 - Shanghai, China Duration: 2010 Dec 5 → 2012 Dec 6 Conference number: 11

Workshop	IEEE Eleventh Workshop on RTL and High Level Testing, 2010
Abbreviated title	WRTLT10
Country/Territory	China
City	Shanghai
Period	2010/12/05 → 2012/12/06

Subject classification (UKÄ)

@conference{2cc462879e294e8e8be8dea987504069,

title = "Checking Pipelined Distributed Global Properties for Post-silicon Debug",

author = "Erik Larsson and Bart Vermeulen and Kees Goossens",

year = "2010",

language = "English",

note = "IEEE Eleventh Workshop on RTL and High Level Testing, 2010, WRTLT10 ; Conference date: 05-12-2010 Through 06-12-2012",

}