Clutter analysis in a time-domain millimeter-wave reflectometry setup

Sebastian Heunisch, Lars Ohlsson, Lars Erik Wernersson

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

In this work, we study the clutter and multi-path propagation in a time-domain millimeter-wave reflectometry setup, used for material characterization or short-range imaging. The signal energy and fidelity factor of the different reflection components is analyzed in dependence of the distance from the target. Due to the change in pulse distortion in the multi-path components, the system impulse response is dependent on the target position. The principal reflection from the target on the other hand is only influenced by the path loss. By coherent superposition we are able to separate the target reflection from the static system clutter and multi-path reflections in the setup.

Original languageEnglish
Title of host publication 12th European Conference on Antennas and Propagation (EuCAP 2018)
DOIs
Publication statusPublished - 2018
Event12th European Conference on Antennas and Propagation, EuCAP 2018 - London, United Kingdom
Duration: 2018 Apr 92018 Apr 13

Conference

Conference12th European Conference on Antennas and Propagation, EuCAP 2018
Country/TerritoryUnited Kingdom
CityLondon
Period2018/04/092018/04/13

Subject classification (UKÄ)

  • Signal Processing

Free keywords

  • Clutter
  • Millimeter-wave reflectrometry
  • Multi-path propagation
  • Time-domain measurements

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