Correlation lengths in stacked InAs quantum dot systems studied by cross-sectional scanning tunnelling microscopy

Lassana Ouattara, J. M. Ulloa, Anders Mikkelsen, Edvin Lundgren, P. M. Koenraad, Magnus Borgström, Lars Samuelson, Werner Seifert

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied the influence of the InP spacer layer thickness on stacked InAs/InP quantum dots, using cross-sectional scanning tunnelling microscopy. We show that for a spacer layer thickness of up to 30 nm, the quantum dots are spatially correlated but for a separating distance of 50 nm the vertical ordering of the dots is lost. These values are the same as previously found for quantum dots in the InAs/GaAs system despite the large difference in lattice mismatch between the InAs/GaAs ( 7%) and InAs/InP ( 3%) systems. We show that the apparent similarities can be understood by a combination of intermixing in the dots and differences in dot size. Finally, we demonstrate that the size of the quantum dots is affected by their vertical correlation.
Original languageEnglish
Article number145403
JournalNanotechnology
Volume18
Issue number14
DOIs
Publication statusPublished - 2007

Subject classification (UKÄ)

  • Nano Technology

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