Designing and Modeling of a High-Speed Scanner for Atomic Force Microscopy

G. Schitter, Karl Johan Åström, B. DeMartini, G.E. Fantner, Ph. J. Thurner, K.J. Turner, P.K. Hansma

Research output: Contribution to conferencePaper, not in proceedingpeer-review

Original languageEnglish
Publication statusPublished - 2006
EventAmerican Control Conference, 2006 - Minneapolis, Minnesota, United States
Duration: 2006 Jun 142006 Jun 16

Conference

ConferenceAmerican Control Conference, 2006
Country/TerritoryUnited States
CityMinneapolis, Minnesota
Period2006/06/142006/06/16

Subject classification (UKÄ)

  • Control Engineering

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