Abstract
In this paper, we report on the development of a vertical wrap-gated field-effect transistor based on epitaxially grown InAs nanowires. We discuss some of the important steps involved in the growth and processing, such as nanowire position control in situ doping, high-kappa dielectric deposition, spacer layer formation: and metal wrap-gate fabrication. In particular, we compare a few alternative methods for deposition of materials onto vertical structures and discuss their potential advantages and limitations. Finally, we also present a comparison of transistor performance for nanowires grown using two different epitaxial techniques.
| Original language | English |
|---|---|
| Pages (from-to) | 3030-3036 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 55 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 2008 |
Subject classification (UKÄ)
- Condensed Matter Physics (including Material Physics, Nano Physics)
- Electrical Engineering, Electronic Engineering, Information Engineering
Free keywords
- nanowire
- Field-effect transistor (FET)
- InAs
- wrap gate
- surround gate
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