Differential measurement and parameter extraction of symmetrical inductors

Niklas Troedsson, Johan Wernehag, Henrik Sjöland

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

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Abstract

Measurements and extraction of Q-value and self-resonance frequency of on-chip differential symmetrical inductors have been performed. Both 1-port and 2-port measurements have been carried out. In the 1-port measurements a high frequency broadband 180
Original languageEnglish
Title of host publication[Host publication title missing]
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
Pages289-292
Number of pages4
ISBN (Print)1-4244-0064-3
DOIs
Publication statusPublished - 2005
EventNORCHIP Conference, 2005 - Oulu, Finland
Duration: 2005 Nov 212005 Nov 22

Conference

ConferenceNORCHIP Conference, 2005
Country/TerritoryFinland
CityOulu
Period2005/11/212005/11/22

Subject classification (UKÄ)

  • Electrical Engineering, Electronic Engineering, Information Engineering

Free keywords

  • Indentro
  • parameter extraction
  • differential signals
  • inductor optimization program
  • self-resonance frequency
  • differential circuit
  • Q-value
  • differential symmetrical inductors
  • 1-port measurements
  • 2-port measurements
  • FastHenry

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