Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device

Lert Chayanun, Lukas Hrachowina, Alexander Björling, Magnus T. Borgström, Jesper Wallentin

Research output: Contribution to journalArticlepeer-review

Abstract

Nanoscale X-ray detectors could allow higher resolution in imaging and diffraction experiments than established systems but are difficult to design due to the long absorption length of X-rays. Here, we demonstrate X-ray detection in a single nanowire in which the nanowire axis is parallel to the optical axis. In this geometry, X-ray absorption can occur along the nanowire length, while the spatial resolution is limited by the diameter. We use the device to make a high-resolution 3D image of the 88 nm diameter X-ray nanofocus at the Nanomax beamline, MAX IV synchrotron, by scanning the single pixel device in different planes along the optical axis. The images reveal fine details of the beam that are unattainable with established detectors and show good agreement with ptychography.

Original languageEnglish
Pages (from-to)8326–8331
JournalNano Letters
Volume20
Issue number11
DOIs
Publication statusPublished - 2020

Subject classification (UKÄ)

  • Nano Technology
  • Condensed Matter Physics

Free keywords

  • detector
  • nanofocused X-rays
  • Nanowire
  • X-ray beam induced current

Fingerprint

Dive into the research topics of 'Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device'. Together they form a unique fingerprint.

Cite this