Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs

Markus Hellenbrand, Erik Lind, Olli-Pekka Kilpi, Lars-Erik Wernersson

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2020
Electrical Characterisation of III-V Nanowire MOSFETs
Hellenbrand, M., 2020 May, Lund: Department of Electrical and Information Technology, Lund University. 156 p.
Research output: Thesis › Doctoral Thesis (compilation)

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