Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

M Lundwall; Maxim Tchaplyguine; G Ohrwall; A Lindblad; Sergey Peredkov; T Rander; S Svensson; O Bjorneholm

doi:10.1016/j.susc.2005.07.007

Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

M Lundwall, Maxim Tchaplyguine, G Ohrwall, A Lindblad, Sergey Peredkov, T Rander, S Svensson, O Bjorneholm

Research output: Contribution to journal › Article › peer-review

Abstract

The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

Original language	English
Pages (from-to)	12-19
Journal	Surface Science
Volume	594
Issue number	1-3
DOIs	https://doi.org/10.1016/j.susc.2005.07.007
Publication status	Published - 2005

Subject classification (UKÄ)

Natural Sciences
Atom and Molecular Physics and Optics
Physical Sciences

Free keywords

photoelectron
Auger ejection
photoelectron spectroscopy
spectroscopy
Auger electron
surface sensitivity
effective attenuation length-
synchrotron radiation photoelectron spectroscopy
emission

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10.1016/j.susc.2005.07.007

Cite this

@article{aeeea176a39944558ef84ed92c996a10,

title = "Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters",

abstract = "The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.",

keywords = "photoelectron, Auger ejection, photoelectron spectroscopy, spectroscopy, Auger electron, surface sensitivity, effective attenuation length-, synchrotron radiation photoelectron spectroscopy, emission",

author = "M Lundwall and Maxim Tchaplyguine and G Ohrwall and A Lindblad and Sergey Peredkov and T Rander and S Svensson and O Bjorneholm",

year = "2005",

doi = "10.1016/j.susc.2005.07.007",

language = "English",

volume = "594",

pages = "12--19",

journal = "Surface Science",

issn = "0039-6028",

publisher = "Elsevier",

number = "1-3",

}

TY - JOUR

T1 - Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

AU - Lundwall, M

AU - Tchaplyguine, Maxim

AU - Ohrwall, G

AU - Lindblad, A

AU - Peredkov, Sergey

AU - Rander, T

AU - Svensson, S

AU - Bjorneholm, O

PY - 2005

Y1 - 2005

N2 - The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

AB - The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.

KW - photoelectron

KW - Auger ejection

KW - photoelectron spectroscopy

KW - spectroscopy

KW - Auger electron

KW - surface sensitivity

KW - effective attenuation length-

KW - synchrotron radiation photoelectron spectroscopy

KW - emission

U2 - 10.1016/j.susc.2005.07.007

DO - 10.1016/j.susc.2005.07.007

M3 - Article

SN - 0039-6028

VL - 594

SP - 12

EP - 19

JO - Surface Science

JF - Surface Science

IS - 1-3

ER -

Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

Abstract

Subject classification (UKÄ)

Free keywords

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