Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface

Cristina Fernandez-Martin; Stephen J. Roser; Karen J. Edler

doi:10.1039/b716662a

Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface

Cristina Fernandez-Martin, Stephen J. Roser, Karen J. Edler

University of Bath

Research output: Contribution to journal › Article › peer-review

Abstract

Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C₁₆EO₈) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C₁₆EO₈ molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.

Original language	English
Pages (from-to)	1222-1231
Number of pages	10
Journal	Journal of Materials Chemistry
Volume	18
Issue number	11
DOIs	https://doi.org/10.1039/b716662a
Publication status	Published - 2008
Externally published	Yes

Access to Document

10.1039/b716662a

Cite this

@article{bc8134f8abf740f9b17be4ab2e3b0f68,

title = "Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface",

abstract = "Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.",

author = "Cristina Fernandez-Martin and Roser, {Stephen J.} and Edler, {Karen J.}",

year = "2008",

doi = "10.1039/b716662a",

language = "English",

volume = "18",

pages = "1222--1231",

journal = "Journal of Materials Chemistry",

issn = "0959-9428",

publisher = "Royal Society of Chemistry",

number = "11",

}

TY - JOUR

T1 - Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface

AU - Fernandez-Martin, Cristina

AU - Roser, Stephen J.

AU - Edler, Karen J.

PY - 2008

Y1 - 2008

N2 - Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.

AB - Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.

U2 - 10.1039/b716662a

DO - 10.1039/b716662a

M3 - Article

AN - SCOPUS:40449137446

SN - 0959-9428

VL - 18

SP - 1222

EP - 1231

JO - Journal of Materials Chemistry

JF - Journal of Materials Chemistry

IS - 11

ER -

Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface

Abstract

Access to Document

Fingerprint

Cite this