Fabrication and modeling of a combined gold nanoparticle-carbon nanotube single electron transistor

Claes Thelander, Martin Magnusson, Knut Deppert, Lars Samuelson, P.R. Poulsen, J. Nygard, J. Borggreen

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

Scanning probe manipulation has been used to electrically connect two carbon nanotubes to an individual 7 nm gold particle, resulting in a system with multiple tunnel junctions. Single-electron charging effects in the gold particle was found to dominate the electrical transport measurements at T=4.2 K, whereas charging effects in the two carbon nanotube leads appeared as a fine structure. A simulation of the electrical transport in the system has been carried out using SIMON*, which is a Monte Carlo based simulation program for single-electronics. Using this program we have been able to fit a model to the experimental data and to explain the electrical transport characteristics
Original languageEnglish
Title of host publication7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
PublisherLund University
Number of pages2
Publication statusPublished - 2002
EventProceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21) - Malmö, Sweden
Duration: 2002 Jun 242002 Jun 28

Conference

ConferenceProceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
Country/TerritorySweden
CityMalmö
Period2002/06/242002/06/28

Subject classification (UKÄ)

  • Condensed Matter Physics

Keywords

  • electrical transport measurements
  • single electron charging effects
  • multiple tunnel junctions
  • electrical contacts
  • scanning probe manipulation
  • transistor modelling
  • transistor fabrication
  • single electron transistor
  • gold nanoparticle
  • carbon nanotube
  • fine structure
  • simulation of nanostructures
  • Monte Carlo based simulation
  • 7 nm
  • 4.2 K
  • Au-C

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