Formation of Sm silicides on Si(111): composition and epitaxy

C. Wigren, J. N. Andersen, R. Nyholm, U. O. Karlsson

Research output: Contribution to journalArticlepeer-review

Abstract

The formation of Sm silicides on Si(111) by means of solid phase epitaxy has been studied with low energy electron diffraction, Auger electron spectroscopy and photoelectron spectroscopy of the Sm 4f level and Si 2p level. A limited reaction is found to occur already at room temperature whereas at higher temperatures a strongly intermixed Sm/Si layer showing some long range order is formed. The Sm atoms of this intermixed phase are found to be completely trivalent in accordance with expectations. The intermixed layer consists of two silicides with different compositions, one of them being SmSi2-x, the other being tentatively ascribed to SmSi.

Original languageEnglish
Pages (from-to)254-259
Number of pages6
JournalSurface Science
Volume293
Issue number3
DOIs
Publication statusPublished - 1993 Aug 20

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