Abstract
We present a theory for the full distribution of current fluctuations in incoherent diffusive superconducting junctions, subjected to a voltage bias. This theory of full counting statistics of incoherent multiple Andreev reflections is valid for an arbitrary applied voltage. We present a detailed discussion of the properties of the first four cumulants as well as the low and high voltage regimes of the full counting statistics. The work presented here is an extension of the results of Pilgram et al. [31].
| Original language | English |
|---|---|
| Pages (from-to) | 619-624 |
| Journal | Applied Physics A: Materials Science & Processing |
| Volume | 89 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2007 |
Subject classification (UKÄ)
- Condensed Matter Physics (including Material Physics, Nano Physics)