Hard x-ray nanoprobe of beamline P06 at PETRA III

C. G. Schroer, C. Baumbach, R. Döhrmann, S. Klare, R. Hoppe, M. Kahnt, J. Patommel, J. Reinhardt, S. Ritter, D. Samberg, M. Scholz, A. Schropp, F. Seiboth, M. Seyrich, F. Wittwer, G. Falkenberg

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

14 Citations (SciVal)

Abstract

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

Original languageEnglish
Title of host publicationProceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
EditorsOleg Chubar, Ignace Jarrige, Konstantine Kaznatcheev, Lisa Miller, Eli Stavitski, Toshiya Tanabe, Timur Shaftan, Qun Shen, Ronald Pindak, Christie Nelson, Sebastian Kalbfleisch, Juergen Thieme, Garth Williams, Martin Fuchs, Abdul Rumaiz, Jun Wang, Kenneth Evans-Lutterodt, Wah-Keat Lee, Sean McSweeney, Elio Vescovo
PublisherAmerican Institute of Physics (AIP)
Volume1741
ISBN (Electronic)9780735413986
DOIs
Publication statusPublished - 2016 Jul 27
Externally publishedYes
Event12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 - New York, United States
Duration: 2015 Jul 62015 Jul 10

Conference

Conference12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Country/TerritoryUnited States
CityNew York
Period2015/07/062015/07/10

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