Abstract
High-efficiency microfocusing of multi-keV X-rays at synchrotron sources is highly profitable for spatially resolved structural analysis of many kinds. Because radiation from synchrotron sources is typically elongated along the horizontal dimension, generating a microbeam that is isotropic in size requires a carefully designed optics system. Here we report on using a combination of a horizontally tunable slit downstream of the undulator source with elliptical diffractive Fresnel zone plates. We demonstrate the arrangement in context of small-angle X-ray scattering experiments, obtaining a microbeam of 2.2 μm ×1.8 μm (X × Y) with a flux of 1.2 × 1010 photons/s at an energy of 11.2 keV at the sample position.
Original language | English |
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Pages (from-to) | 21145-21158 |
Number of pages | 14 |
Journal | Optics Express |
Volume | 25 |
Issue number | 18 |
DOIs | |
Publication status | Published - 2017 |
Subject classification (UKÄ)
- Accelerator Physics and Instrumentation