Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

Original language	English
Title of host publication	Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)
Publication status	Published - 2004
Event	8th International Conference on Nanometer-Scale Science and Technology, 2004 - Venice, Italy Duration: 2004 Jun 28 → 2004 Jul 2 Conference number: 8

Conference	8th International Conference on Nanometer-Scale Science and Technology, 2004
Abbreviated title	NANO-8
Country/Territory	Italy
City	Venice
Period	2004/06/28 → 2004/07/02

Subject classification (UKÄ)

@inproceedings{b0e9cfec7b2840dbae0118b11c57dfce,

title = "Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy",

author = "Lassana Ouattara and Anders Mikkelsen and Magnus Borgstr{\"o}m and Lars Samuelson and Werner Seifert and Edvin Lundgren",

year = "2004",

language = "English",

booktitle = "Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)",

note = "8th International Conference on Nanometer-Scale Science and Technology, 2004, NANO-8 ; Conference date: 28-06-2004 Through 02-07-2004",

}

Ouattara, L, Mikkelsen, A , Borgström, M , Samuelson, L, Seifert, W & Lundgren, E 2004, Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy. in Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004). 8th International Conference on Nanometer-Scale Science and Technology, 2004, Venice, Italy, 2004/06/28.

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

TY - GEN

T1 - Influence of the spacer layer distance in stacked InAs/InP quantum dots, studied by cross-sectional scanning tunneling microscopy

AU - Ouattara, Lassana

AU - Mikkelsen, Anders

AU - Borgström, Magnus

AU - Samuelson, Lars

AU - Seifert, Werner

AU - Lundgren, Edvin

N1 - Conference code: 8

PY - 2004

Y1 - 2004

M3 - Paper in conference proceeding

BT - Book of extended abstracts: 8th Intl Conf Nanoscale Sci Technol, Venice, Italy (2004)

T2 - 8th International Conference on Nanometer-Scale Science and Technology, 2004

Y2 - 28 June 2004 through 2 July 2004

ER -