@inproceedings{05e1d0026d264dfa83704239620daa20,
title = "Integrated Test Scheduling, Test Parallelization and TAM Design",
abstract = "We propose a technique integrating test scheduling, scan chain partitioning and test access mechanism (TAM) design minimizing the test time and the TAM routing cost while considering test conflicts and power constraints. Main features of our technique are (1) the flexibility in modelling the systems test behaviour and (2) the support for interconnection test of unwrapped cores and user-defined logic. Experiments using our implementation on several benchmarks and industrial designs demonstrate that it produces high quality solution at low computational cost.",
keywords = "test access mechanism, TAM, TAM routing, test scheduling, scan chain partitioning, test conflicts, power constraints",
author = "Erik Larsson and Klas Arvidsson and Hideo Fujiwara and Zebo Peng",
year = "2002",
doi = "10.1109/ATS.2002.1181744",
language = "English",
isbn = "0-7695-1825-7",
publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",
pages = "397--404",
booktitle = "[Host publication title missing]",
address = "United States",
note = "IEEE Asian Test Symposium ATS02 ; Conference date: 18-11-2002 Through 20-11-2002",
}