Large magnetoresistance in Co/Ni/Co ferromagnetic single electron transistors

Ruisheng Liu, H. Pettersson, L. Michalak, C. M. Canali, Dmitry Suyatin, Lars Samuelson

Research output: Contribution to journalArticlepeer-review

Abstract

The authors report on magnetotransport investigations of nanoscaled ferromagnetic Co/Ni/Co single electron transistors. As a result of reduced size, the devices exhibit single electron transistor characteristics at 4.2 K. Magnetotransport measurements carried out at 1.8 K reveal tunneling magnetoresistance (TMR) traces with negative coercive fields, which the authors interpret in terms of a switching mechanism driven by the shape anisotropy of the central wirelike Ni island. A large TMR of about 18% is observed within a finite source-drain bias regime. The TMR decreases rapidly with increasing bias, which the authors tentatively attribute to excitation of magnons in the central island. (c) 2007 American Institute of Physics.
Original languageEnglish
JournalApplied Physics Letters
Volume90
Issue number12
DOIs
Publication statusPublished - 2007

Subject classification (UKÄ)

  • Condensed Matter Physics (including Material Physics, Nano Physics)

Fingerprint

Dive into the research topics of 'Large magnetoresistance in Co/Ni/Co ferromagnetic single electron transistors'. Together they form a unique fingerprint.

Cite this