Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

G Pausch; M Moszynski; W Bohne; Joakim Cederkäll; H Grawe; W Klamra; MO Lampert; P Rohr; R Schubart; W Seidel; D Wolski

doi:10.1109/23.603801

Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

G Pausch, M Moszynski, W Bohne, Joakim Cederkäll, H Grawe, W Klamra, MO Lampert, P Rohr, R Schubart, W Seidel, D Wolski

External Organization - Unknown

Research output: Contribution to journal › Article › peer-review

Abstract

Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field.

Original language	English
Pages (from-to)	1040-1045
Journal	IEEE Transactions on Nuclear Science
Volume	44
Issue number	3
DOIs	https://doi.org/10.1109/23.603801
Publication status	Published - 1997
Externally published	Yes

Subject classification (UKÄ)

Subatomic Physics

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10.1109/23.603801

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title = "Limitations of the pulse-shape technique for particle discrimination in planar Si detectors",

abstract = "Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field.",

author = "G Pausch and M Moszynski and W Bohne and Joakim Cederk{\"a}ll and H Grawe and W Klamra and MO Lampert and P Rohr and R Schubart and W Seidel and D Wolski",

year = "1997",

doi = "10.1109/23.603801",

language = "English",

volume = "44",

pages = "1040--1045",

journal = "IEEE Transactions on Nuclear Science",

issn = "0018-9499",

publisher = "IEEE - Institute of Electrical and Electronics Engineers Inc.",

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T1 - Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

AU - Pausch, G

AU - Moszynski, M

AU - Bohne, W

AU - Cederkäll, Joakim

AU - Grawe, H

AU - Klamra, W

AU - Lampert, MO

AU - Rohr, P

AU - Schubart, R

AU - Seidel, W

AU - Wolski, D

PY - 1997

Y1 - 1997

N2 - Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field.

AB - Limitations of the pulse-shape discrimination (PSD) technique - a promising method to identify the charged particles stopped in planar Si-detectors - have been investigated. The particle resolution turned out to be basically determined by resistivity fluctuations in the bulk silicon which cause the charge-collection time to depend on the point of impact. Detector maps showing these fluctuations have been measured and are discussed. Furthermore we present a simple method to test the performance of detectors with respect to PSD. Another limitation of the PSD technique is the finite energy threshold for particle identification. This threshold is caused by an unexpected decrease of the total charge-collection time for ions with a short range, in spite of the fact that the particle tracks are located in a region of very low electric field.

U2 - 10.1109/23.603801

DO - 10.1109/23.603801

M3 - Article

SN - 0018-9499

VL - 44

SP - 1040

EP - 1045

JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

IS - 3

ER -

Limitations of the pulse-shape technique for particle discrimination in planar Si detectors

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