Abstract
We describe a compact and practically debris-free laser-plasma x-ray source suitable for proximity lithography. The source is based on a microscopic fluorocarbon continuous liquid jet droplet target, generating high-brightness lambda=1.2-1.7 nm x-ray emission with similar to 5% conversion efficiency. This target type has the advantages of producing only negligible amounts of debris, and being regenerative, thereby allowing high-repetition-rate uninterrupted operation. The source is combined with an Au/SiNx x-ray mask to demonstrate lithography of sub-100 nm structures in SAL-601 chemically enhanced resist.
| Original language | English |
|---|---|
| Pages (from-to) | 535-536 |
| Journal | Microelectronic Engineering |
| Volume | 35 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - 1997 |
Bibliographical note
The information about affiliations in this record was updated in December 2015.The record was previously connected to the following departments: Atomic physics (011013005), Physics, Faculty of Technology (011013200)
Subject classification (UKÄ)
- Atom and Molecular Physics and Optics
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