Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

H. Takenaka; N. Kuwabara; N. Kamachi; S. Y. Liu; K. Endo; T. Ohchi; S. Ichimaru; H. Kimura; J. Laksman; F. Hennies; W. Grizolli; R. Sankari

doi:10.1007/978-3-319-73025-7_43

Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

H. Takenaka, N. Kuwabara, N. Kamachi, S. Y. Liu, K. Endo, T. Ohchi, S. Ichimaru, H. Kimura, J. Laksman, F. Hennies, W. Grizolli, R. Sankari

MAX IV Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

Abstract

The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B₄C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

Original language	English
Title of host publication	X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
Publisher	Springer Science and Business Media B.V.
Pages	291-295
Number of pages	5
Volume	202
ISBN (Print)	9783319730240
DOIs	https://doi.org/10.1007/978-3-319-73025-7_43
Publication status	Published - 2018
Event	15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan Duration: 2016 May 22 → 2016 May 27

Conference

Conference	15th International Conference on X-Ray Lasers, ICXRL 2016
Country/Territory	Japan
City	Nara
Period	2016/05/22 → 2016/05/27

Subject classification (UKÄ)

Subatomic Physics

Access to Document

10.1007/978-3-319-73025-7_43

Cite this

Takenaka, H., Kuwabara, N., Kamachi, N., Liu, S. Y., Endo, K., Ohchi, T., Ichimaru, S., Kimura, H., Laksman, J., Hennies, F., Grizolli, W., & Sankari, R. (2018). Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray. In X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers (Vol. 202, pp. 291-295). Springer Science and Business Media B.V.. https://doi.org/10.1007/978-3-319-73025-7_43

@inproceedings{87a6c51344374561bd981cc2db420d83,

title = "Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray",

abstract = "The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.",

author = "H. Takenaka and N. Kuwabara and N. Kamachi and Liu, {S. Y.} and K. Endo and T. Ohchi and S. Ichimaru and H. Kimura and J. Laksman and F. Hennies and W. Grizolli and R. Sankari",

year = "2018",

doi = "10.1007/978-3-319-73025-7_43",

language = "English",

isbn = "9783319730240",

volume = "202",

pages = "291--295",

booktitle = "X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers",

publisher = "Springer Science and Business Media B.V.",

address = "United States",

note = "15th International Conference on X-Ray Lasers, ICXRL 2016 ; Conference date: 22-05-2016 Through 27-05-2016",

}

Takenaka, H, Kuwabara, N, Kamachi, N, Liu, SY, Endo, K, Ohchi, T, Ichimaru, S, Kimura, H, Laksman, J, Hennies, F, Grizolli, W & Sankari, R 2018, Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray. in X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. vol. 202, Springer Science and Business Media B.V., pp. 291-295, 15th International Conference on X-Ray Lasers, ICXRL 2016, Nara, Japan, 2016/05/22. https://doi.org/10.1007/978-3-319-73025-7_43

Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray. / Takenaka, H.; Kuwabara, N.; Kamachi, N. et al.
X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Vol. 202 Springer Science and Business Media B.V., 2018. p. 291-295.

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

TY - GEN

T1 - Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

AU - Takenaka, H.

AU - Kuwabara, N.

AU - Kamachi, N.

AU - Liu, S. Y.

AU - Endo, K.

AU - Ohchi, T.

AU - Ichimaru, S.

AU - Kimura, H.

AU - Laksman, J.

AU - Hennies, F.

AU - Grizolli, W.

AU - Sankari, R.

PY - 2018

Y1 - 2018

N2 - The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

AB - The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

UR - http://www.scopus.com/inward/record.url?scp=85043346899&partnerID=8YFLogxK

U2 - 10.1007/978-3-319-73025-7_43

DO - 10.1007/978-3-319-73025-7_43

M3 - Paper in conference proceeding

AN - SCOPUS:85043346899

SN - 9783319730240

VL - 202

SP - 291

EP - 295

BT - X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers

PB - Springer Science and Business Media B.V.

T2 - 15th International Conference on X-Ray Lasers, ICXRL 2016

Y2 - 22 May 2016 through 27 May 2016

ER -

Takenaka H, Kuwabara N, Kamachi N, Liu SY, Endo K, Ohchi T et al. Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray. In X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers. Vol. 202. Springer Science and Business Media B.V. 2018. p. 291-295 doi: 10.1007/978-3-319-73025-7_43

Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

Abstract

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Subject classification (UKÄ)

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