Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

H. Takenaka, N. Kuwabara, N. Kamachi, S. Y. Liu, K. Endo, T. Ohchi, S. Ichimaru, H. Kimura, J. Laksman, F. Hennies, W. Grizolli, R. Sankari

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

Original languageEnglish
Title of host publicationX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
PublisherSpringer Science and Business Media B.V.
Pages291-295
Number of pages5
Volume202
ISBN (Print)9783319730240
DOIs
Publication statusPublished - 2018
Event15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
Duration: 2016 May 222016 May 27

Conference

Conference15th International Conference on X-Ray Lasers, ICXRL 2016
Country/TerritoryJapan
CityNara
Period2016/05/222016/05/27

Subject classification (UKÄ)

  • Accelerator Physics and Instrumentation

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