Abstract
The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.
Original language | English |
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Title of host publication | X-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers |
Publisher | Springer Science and Business Media B.V. |
Pages | 291-295 |
Number of pages | 5 |
Volume | 202 |
ISBN (Print) | 9783319730240 |
DOIs | |
Publication status | Published - 2018 |
Event | 15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan Duration: 2016 May 22 → 2016 May 27 |
Conference
Conference | 15th International Conference on X-Ray Lasers, ICXRL 2016 |
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Country/Territory | Japan |
City | Nara |
Period | 2016/05/22 → 2016/05/27 |
Subject classification (UKÄ)
- Subatomic Physics