Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

H. Takenaka, N. Kuwabara, N. Kamachi, S. Y. Liu, K. Endo, T. Ohchi, S. Ichimaru, H. Kimura, J. Laksman, F. Hennies, W. Grizolli, R. Sankari

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Fingerprint

Dive into the research topics of 'Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray'. Together they form a unique fingerprint.

Physics & Astronomy