Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

H. Takenaka, N. Kuwabara, N. Kamachi, S. Y. Liu, K. Endo, T. Ohchi, S. Ichimaru, H. Kimura, J. Laksman, F. Hennies, W. Grizolli, R. Sankari

Research output: Chapter in Book/Report/Conference proceeding › Paper in conference proceeding › peer-review

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Physics & Astronomy