Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.
Original languageEnglish
Title of host publication[Host publication title missing]
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
Pages942-945
Number of pages4
Publication statusPublished - 2013
EventInternational Symposium on Electromagnetic Theory (EMTS URSI ) 2013 - Hiroshima, Hiroshima, Japan
Duration: 2013 May 202013 May 23

Publication series

Name
ISSN (Print)2163-405X

Conference

ConferenceInternational Symposium on Electromagnetic Theory (EMTS URSI ) 2013
Country/TerritoryJapan
CityHiroshima
Period2013/05/202013/05/23

Subject classification (UKÄ)

  • Electrical Engineering, Electronic Engineering, Information Engineering

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