Abstract
Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.
| Original language | English |
|---|---|
| Pages (from-to) | 1106-1109 |
| Number of pages | 4 |
| Journal | Optica |
| Volume | 6 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 2019 Jan 1 |
Subject classification (UKÄ)
- Condensed Matter Physics (including Material Physics, Nano Physics)
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