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Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Patrik Vagovič, Tokushi Sato, Ladislav Mikeš, Grant Mills, Rita Graceffa, Frans Mattsson, Pablo Villanueva-Perez, Alexey Ershov, Tomáš Faragó, Jozef Uličný, Henry Kirkwood, Romain Letrun, Rajmund Mokso, Marie Christine Zdora, Margie P. Olbinado, Alexander Rack, Tilo Baumbach, Joachim Schulz, Alke Meents, Henry N. ChapmanAdrian P. Mancuso

Research output: Contribution to journalArticlepeer-review

Abstract

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

Original languageEnglish
Pages (from-to)1106-1109
Number of pages4
JournalOptica
Volume6
Issue number9
DOIs
Publication statusPublished - 2019 Jan 1

Subject classification (UKÄ)

  • Condensed Matter Physics (including Material Physics, Nano Physics)

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