Abstract
Oxide nanoparticle layers have shown interesting behavior as gate materials for high temperature (typically at 300-400°C) metal-insulator-silicon carbide (MISiC) capacitive sensors. Distinct shifts in the depletion region of the C-V (capacitance-voltage) characteristics could be observed while switching between different oxidizing and reducing gas ambients (air, O2, H2, NH3, CO, NOx, C3H6). Shifts were also noticed in the accumulation region of the C-V curves, which can be attributed to the change in resistivity of the gate material. Sensor response patterns have been found to depend on operating temperature.
Original language | English |
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Pages (from-to) | 275-278 |
Journal | Materials and Manufacturing Processes |
Volume | 21 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2006 |
Subject classification (UKÄ)
- Production Engineering, Human Work Science and Ergonomics
Free keywords
- accumulation region
- adsorption
- capacitance voltage (C-V)
- depletion region
- field-effect
- gas sensors
- gate material
- high frequency
- high temperature
- interface
- metal-insulator-seimconductor (MISIC)
- nano particles
- ruthenium oxide
- silicon carbide
- transient response