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Microstructural degradation of silicon electrodes during lithiation observed via operando X-ray tomographic imaging
Oluwadamilola O. Taiwo, Thomas M M Heenan, Donal P Finegan, Juan M. Paz-García, Stephen A. Hall, Rajmund Mokso, Pablo Villanueva-Pérez, Alessandra Patera, Daniel J L Brett, Paul R. Shearing
Research output: Contribution to journal › Article › peer-review