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Microwave Reconstruction of Fabrication Defects in Known Objects Using Scattering Parameter Sensitivities

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceedingpeer-review

Abstract

This paper investigates the detection of permittivity defects in a fabricated, known object, motivated by a desire to detect errors in additively manufactured objects that may affect their electromagnetic performance. We use scattering parameter sensitivities to reconstruct the relative permittivity of a generic 2D object from microwave scattering measurements and a known reference model. To find guidelines for the implementation of a future measurement system, this reconstruction was done using different parameters such as number of antennas used, frequencies, and bandwidth. The effect of bandwidth on the limits of the reconstruction's spatial resolution was investigated, showing a resolution of approximately one tenth of a wavelength, which improves with increased bandwidth.

Original languageEnglish
Title of host publicationEuCAP 2025 - 19th European Conference on Antennas and Propagation
PublisherIEEE - Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9788831299107
DOIs
Publication statusPublished - 2025
Event19th European Conference on Antennas and Propagation, EuCAP 2025 - Stockholm, Sweden
Duration: 2025 Mar 302025 Apr 4

Publication series

NameEuCAP 2025 - 19th European Conference on Antennas and Propagation

Conference

Conference19th European Conference on Antennas and Propagation, EuCAP 2025
Country/TerritorySweden
CityStockholm
Period2025/03/302025/04/04

Subject classification (UKÄ)

  • Signal Processing

Free keywords

  • antennas
  • electromagnetics
  • finite element model
  • microwave
  • reconstruction
  • simulations

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