Abstract
Using synchrotron radiation based spectroscopic methods we have investigated the surface modifications of Ga1-x Mnx As layers due to post growth annealing under amorphous arsenic capping layers. It is established that there is a clear increase of the Mn concentration at the surface after annealing. This is ascribed to a reaction between diffusing Mn interstitials and the As capping. The reacted surface is smooth and well ordered with a 1×2 reconstruction. All data indicate that the annealed (GaMn)As is terminated by a monolayer MnAs in zinc-blende structure.
| Original language | English |
|---|---|
| Article number | 054415 |
| Journal | Physical Review B (Condensed Matter and Materials Physics) |
| Volume | 75 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 2007 Feb 22 |
| Externally published | Yes |
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