Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

Ulrich Vogt, Daniel Köhler, Jannis Dickmann, Jussi Rahomäki, Karolis Parfeniukas, Stefan Kubsky, Filipe Alves, Florent Langlois, Christer Engblom, Tomas Stankevic

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Moiré method for nanometer instability investigation of scanning hard x-ray microscopes'. Together they form a unique fingerprint.

Physics